news
2025.05.23
NEWS
JMIF visit to Beijing
JMIF visited metrology-related organizations in Beijing on April 22nd and 23rd and exchanged opinions about future collaborations.
On the 22nd, the JMIF delegation visited the China Instrument and Control Society (CIS), a leading academic organization in measurement, instrumentation, automation and control industry in China, where they received a great welcome from Mr. Youhua Wu, Honorary Vice Chairman.
The CIS, with a diverse membership of more than 60,000 individuals and 1,662 groups, has 45 professional branches, 11 specialized working committees and connects 30 local sections across China. The meeting concluded that the CIS and JMIF would like to establish a cooperative relationship that can contribute to member companies of both organizations by utilizing each other's resources in the field of measurement.
On the 23rd, JMIF delegation and members from the State Administration for Market Regulation (SAMR), NIM-China, China Society for Measurement (CSM) and China Metrology Association (CMA) exchanged opinions on the legal metrology topics on both countries after touring the mass and flow laboratories of NIM-China Changping district.
Prior to the exchange of opinions, Ms. Zhu, Deputy Director of SAMR stated in her speech that metrology is the foundation of industry and new demands on metrology, such as in the fields of climate change and AI, will require even greater cooperation between Japan and China. JMIF made an invitation to the ICW to be held in 2026.
In the afternoon, JMIF members visited CSM office and dropped by the museum of measuring instruments where members enjoyed learning history of Chinese metrology and of measuring instruments.
JMIF will strive to further build cooperative and productive relationships with metrology-related organizations in China.
Group photo taken at the CIS
The photo of the meeting in the morning on the 23rd
Visit to the museum of measuring instruments